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Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing
In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon oxide, which differ in their sidewall inclination angle. In our approach, these...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4435147/ https://www.ncbi.nlm.nih.gov/pubmed/25730483 http://dx.doi.org/10.3390/s150304796 |