Field-Induced Crystalline-to-Amorphous Phase Transformation on the Si Nano-Apex and the Achieving of Highly Reliable Si Nano-Cathodes

Nano-scale vacuum channel transistors possess merits of higher cutoff frequency and greater gain power as compared with the conventional solid-state transistors. The improvement in cathode reliability is one of the major challenges to obtain high performance vacuum channel transistors. We report the...

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Detalles Bibliográficos
Autores principales: Huang, Yifeng, Deng, Zexiang, Wang, Weiliang, Liang, Chaolun, She, Juncong, Deng, Shaozhi, Xu, Ningsheng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4440211/
https://www.ncbi.nlm.nih.gov/pubmed/25994377
http://dx.doi.org/10.1038/srep10631

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4440211/
https://www.ncbi.nlm.nih.gov/pubmed/25994377
http://dx.doi.org/10.1038/srep10631

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