Ring Counter Based ATPG for Low Transition Test Pattern Generation

In test mode test patterns are applied in random fashion to the circuit under circuit. This increases switching transition between the consecutive test patterns and thereby increases dynamic power dissipation. The proposed ring counter based ATPG reduces vertical switching transitions by inserting t...

Descripción completa

Detalles Bibliográficos
Autores principales: Begam, V. M. Thoulath, Baulkani, S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2015
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4446507/
https://www.ncbi.nlm.nih.gov/pubmed/26075295
http://dx.doi.org/10.1155/2015/729165

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4446507/
https://www.ncbi.nlm.nih.gov/pubmed/26075295
http://dx.doi.org/10.1155/2015/729165

Ejemplares similares