Formation of Nanocomposites by Oxidizing Annealing of SiO(x) and SiO(x)<Er,F> Films: Ellipsometry and FTIR Analysis

The structural-phase transformations induced by air annealing of SiO(x) and SiO(x) < Er,F > films were studied by the combined use of infrared spectroscopy and ellipsometry. The films were prepared using vacuum evaporation of SiO powder and co-evaporation of SiO and ErF(3) powders. The anneali...

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Detalles Bibliográficos
Autores principales: Sopinskyy, Mykola V, Vlasenko, Natalya A, Lisovskyy, Igor P, Zlobin, Sergii O, Tsybrii, Zinoviia F, Veligura, Lyudmyla I
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2015
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4447741/
https://www.ncbi.nlm.nih.gov/pubmed/26034423
http://dx.doi.org/10.1186/s11671-015-0933-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4447741/
https://www.ncbi.nlm.nih.gov/pubmed/26034423
http://dx.doi.org/10.1186/s11671-015-0933-0

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