Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy

Precise measurement and characterization of electrostatic potential structures and the concomitant electric fields at nanodimensions are essential to understand and control the properties of modern materials and devices. However, directly observing and measuring such local electric field information...

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Detalles Bibliográficos
Autores principales: Shibata, Naoya, Findlay, Scott D., Sasaki, Hirokazu, Matsumoto, Takao, Sawada, Hidetaka, Kohno, Yuji, Otomo, Shinya, Minato, Ryuichiro, Ikuhara, Yuichi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4464396/
https://www.ncbi.nlm.nih.gov/pubmed/26067359
http://dx.doi.org/10.1038/srep10040

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4464396/
https://www.ncbi.nlm.nih.gov/pubmed/26067359
http://dx.doi.org/10.1038/srep10040

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