Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning

Screw dislocations play an important role in materials' mechanical, electrical and optical properties. However, imaging the atomic displacements in screw dislocations remains challenging. Although advanced electron microscopy techniques have allowed atomic-scale characterization of edge disloca...

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Detalles Bibliográficos
Autores principales: Yang, H., Lozano, J. G., Pennycook, T. J., Jones, L., Hirsch, P. B., Nellist, P. D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Pub. Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4468905/
https://www.ncbi.nlm.nih.gov/pubmed/26041257
http://dx.doi.org/10.1038/ncomms8266

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4468905/
https://www.ncbi.nlm.nih.gov/pubmed/26041257
http://dx.doi.org/10.1038/ncomms8266

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