MoS(2) Heterojunctions by Thickness Modulation

In this work, we report lateral heterojunction formation in as-exfoliated MoS(2) flakes by thickness modulation. Kelvin probe force microscopy is used to map the surface potential at the monolayer-multilayer heterojunction, and consequently the conduction band offset is extracted. Scanning photocurr...

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Detalles Bibliográficos
Autores principales: Tosun, Mahmut, Fu, Deyi, Desai, Sujay B., Ko, Changhyun, Seuk Kang, Jeong, Lien, Der-Hsien, Najmzadeh, Mohammad, Tongay, Sefaattin, Wu, Junqiao, Javey, Ali
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4485222/
https://www.ncbi.nlm.nih.gov/pubmed/26121940
http://dx.doi.org/10.1038/srep10990

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4485222/
https://www.ncbi.nlm.nih.gov/pubmed/26121940
http://dx.doi.org/10.1038/srep10990

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