Application of synchrotron through-the-substrate microdiffraction to crystals in polished thin sections

The synchrotron through-the-substrate X-ray microdiffraction technique (tts-μXRD) is extended to the structural study of microvolumes of crystals embedded in polished thin sections of compact materials [Rius, Labrador, Crespi, Frontera, Vallcorba & Melgarejo (2011 ▸). J.Synchrotron Rad. 18, 891–...

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Detalles Bibliográficos
Autores principales: Rius, Jordi, Vallcorba, Oriol, Frontera, Carlos, Peral, Inmaculada, Crespi, Anna, Miravitlles, Carles
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Feature Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4491317/
https://www.ncbi.nlm.nih.gov/pubmed/26175904
http://dx.doi.org/10.1107/S2052252515007794

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4491317/
https://www.ncbi.nlm.nih.gov/pubmed/26175904
http://dx.doi.org/10.1107/S2052252515007794

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