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Application of synchrotron through-the-substrate microdiffraction to crystals in polished thin sections
The synchrotron through-the-substrate X-ray microdiffraction technique (tts-μXRD) is extended to the structural study of microvolumes of crystals embedded in polished thin sections of compact materials [Rius, Labrador, Crespi, Frontera, Vallcorba & Melgarejo (2011 ▸). J.Synchrotron Rad. 18, 891–...
Autores principales: | Rius, Jordi, Vallcorba, Oriol, Frontera, Carlos, Peral, Inmaculada, Crespi, Anna, Miravitlles, Carles |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4491317/ https://www.ncbi.nlm.nih.gov/pubmed/26175904 http://dx.doi.org/10.1107/S2052252515007794 |
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