Optical Sectioning and High Resolution in Single-Slice Structured Illumination Microscopy by Thick Slice Blind-SIM Reconstruction

The microscope image of a thick fluorescent sample taken at a given focal plane is plagued by out-of-focus fluorescence and diffraction limited resolution. In this work, we show that a single slice of Structured Illumination Microscopy (two or three beam SIM) data can be processed to provide an imag...

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Detalles Bibliográficos
Autores principales: Jost, Aurélie, Tolstik, Elen, Feldmann, Polina, Wicker, Kai, Sentenac, Anne, Heintzmann, Rainer
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2015
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4493150/
https://www.ncbi.nlm.nih.gov/pubmed/26147644
http://dx.doi.org/10.1371/journal.pone.0132174

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4493150/
https://www.ncbi.nlm.nih.gov/pubmed/26147644
http://dx.doi.org/10.1371/journal.pone.0132174

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