Surface Termination Conversion during SrTiO(3) Thin Film Growth Revealed by X-ray Photoelectron Spectroscopy

Emerging electrical and magnetic properties of oxide interfaces are often dominated by the termination and stoichiometry of substrates and thin films, which depend critically on the growth conditions. Currently, these quantities have to be measured separately with different sophisticated techniques....

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Detalles Bibliográficos
Autores principales: Baeumer, Christoph, Xu, Chencheng, Gunkel, Felix, Raab, Nicolas, Heinen, Ronja Anika, Koehl, Annemarie, Dittmann, Regina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4507138/
https://www.ncbi.nlm.nih.gov/pubmed/26189436
http://dx.doi.org/10.1038/srep11829

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4507138/
https://www.ncbi.nlm.nih.gov/pubmed/26189436
http://dx.doi.org/10.1038/srep11829

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