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Surface Termination Conversion during SrTiO(3) Thin Film Growth Revealed by X-ray Photoelectron Spectroscopy
Emerging electrical and magnetic properties of oxide interfaces are often dominated by the termination and stoichiometry of substrates and thin films, which depend critically on the growth conditions. Currently, these quantities have to be measured separately with different sophisticated techniques....
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4507138/ https://www.ncbi.nlm.nih.gov/pubmed/26189436 http://dx.doi.org/10.1038/srep11829 |