Localized Tail States and Electron Mobility in Amorphous ZnON Thin Film Transistors

The density of localized tail states in amorphous ZnON (a-ZnON) thin film transistors (TFTs) is deduced from the measured current-voltage characteristics. The extracted values of tail state density at the conduction band minima (N(tc)) and its characteristic energy (kT(t)) are about 2 × 10(20) cm(−3...

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Detalles Bibliográficos
Autores principales: Lee, Sungsik, Nathan, Arokia, Ye, Yan, Guo, Yuzheng, Robertson, John
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4548246/
https://www.ncbi.nlm.nih.gov/pubmed/26304606
http://dx.doi.org/10.1038/srep13467

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4548246/
https://www.ncbi.nlm.nih.gov/pubmed/26304606
http://dx.doi.org/10.1038/srep13467

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