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Localized Tail States and Electron Mobility in Amorphous ZnON Thin Film Transistors

The density of localized tail states in amorphous ZnON (a-ZnON) thin film transistors (TFTs) is deduced from the measured current-voltage characteristics. The extracted values of tail state density at the conduction band minima (N(tc)) and its characteristic energy (kT(t)) are about 2 × 10(20) cm(−3...

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Detalles Bibliográficos
Autores principales:	Lee, Sungsik, Nathan, Arokia, Ye, Yan, Guo, Yuzheng, Robertson, John
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2015
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4548246/ https://www.ncbi.nlm.nih.gov/pubmed/26304606 http://dx.doi.org/10.1038/srep13467

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