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MEMS Young’s Modulus and Step Height Measurements With Round Robin Results

This paper presents the results of a microelectromechanical systems (MEMS) Young’s modulus and step height round robin experiment, completed in April 2009, which compares Young’s modulus and step height measurement results at a number of laboratories. The purpose of the round robin was to provide da...

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Detalles Bibliográficos
Autores principales: Marshall, Janet, Allen, Richard A., McGray, Craig D., Geist, Jon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2010
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4548872/
https://www.ncbi.nlm.nih.gov/pubmed/27134790
http://dx.doi.org/10.6028/jres.115.023
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author Marshall, Janet
Allen, Richard A.
McGray, Craig D.
Geist, Jon
author_facet Marshall, Janet
Allen, Richard A.
McGray, Craig D.
Geist, Jon
author_sort Marshall, Janet
collection PubMed
description This paper presents the results of a microelectromechanical systems (MEMS) Young’s modulus and step height round robin experiment, completed in April 2009, which compares Young’s modulus and step height measurement results at a number of laboratories. The purpose of the round robin was to provide data for the precision and bias statements of two \ related Semiconductor Equipment and Materials International (SEMI) standard test methods for MEMS. The technical basis for the test methods on Young’s modulus and step height measurements are also provided in this paper. Using the same test method, the goal of the round robin was to assess the repeatability of measurements at one laboratory, by the same operator, with the same equipment, in the shortest practical period of time as well as the reproducibility of measurements with independent data sets from unique combinations of measurement setups and researchers. Both the repeatability and reproducibility measurements were done on random test structures made of the same homogeneous material. The average repeatability Young’s modulus value (as obtained from resonating oxide cantilevers) was 64.2 GPa with 95 % limits of ± 10.3 % and an average combined standard uncertainty value of 3.1 GPa. The average reproducibility Young’s modulus value was 62.8 GPa with 95 % limits of ± 11.0 % and an average combined standard uncertainty value of 3.0 GPa. The average repeatability step height value (for a metal2-over-poly1 step from active area to field oxide) was 0.477 μm with 95 % limits of 7.9 % and an average combined standard uncertainty value of 0.014 μm. The average reproducibility step height value was 0.481 μm with 95 % limits of ± 6.2 % and an average combined standard uncertainty value of 0.014 μm. In summary, this paper demonstrates that a reliable methodology can be used to measure Young’s modulus and step height. Furthermore, a micro and nano technology (MNT) 5-in-1 standard reference material (SRM) can be used by industry to compare their in-house measurements using this methodology with NIST measurements thereby validating their use of the documentary standards.
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spelling pubmed-45488722016-04-29 MEMS Young’s Modulus and Step Height Measurements With Round Robin Results Marshall, Janet Allen, Richard A. McGray, Craig D. Geist, Jon J Res Natl Inst Stand Technol Article This paper presents the results of a microelectromechanical systems (MEMS) Young’s modulus and step height round robin experiment, completed in April 2009, which compares Young’s modulus and step height measurement results at a number of laboratories. The purpose of the round robin was to provide data for the precision and bias statements of two \ related Semiconductor Equipment and Materials International (SEMI) standard test methods for MEMS. The technical basis for the test methods on Young’s modulus and step height measurements are also provided in this paper. Using the same test method, the goal of the round robin was to assess the repeatability of measurements at one laboratory, by the same operator, with the same equipment, in the shortest practical period of time as well as the reproducibility of measurements with independent data sets from unique combinations of measurement setups and researchers. Both the repeatability and reproducibility measurements were done on random test structures made of the same homogeneous material. The average repeatability Young’s modulus value (as obtained from resonating oxide cantilevers) was 64.2 GPa with 95 % limits of ± 10.3 % and an average combined standard uncertainty value of 3.1 GPa. The average reproducibility Young’s modulus value was 62.8 GPa with 95 % limits of ± 11.0 % and an average combined standard uncertainty value of 3.0 GPa. The average repeatability step height value (for a metal2-over-poly1 step from active area to field oxide) was 0.477 μm with 95 % limits of 7.9 % and an average combined standard uncertainty value of 0.014 μm. The average reproducibility step height value was 0.481 μm with 95 % limits of ± 6.2 % and an average combined standard uncertainty value of 0.014 μm. In summary, this paper demonstrates that a reliable methodology can be used to measure Young’s modulus and step height. Furthermore, a micro and nano technology (MNT) 5-in-1 standard reference material (SRM) can be used by industry to compare their in-house measurements using this methodology with NIST measurements thereby validating their use of the documentary standards. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2010 2010-10-01 /pmc/articles/PMC4548872/ /pubmed/27134790 http://dx.doi.org/10.6028/jres.115.023 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Marshall, Janet
Allen, Richard A.
McGray, Craig D.
Geist, Jon
MEMS Young’s Modulus and Step Height Measurements With Round Robin Results
title MEMS Young’s Modulus and Step Height Measurements With Round Robin Results
title_full MEMS Young’s Modulus and Step Height Measurements With Round Robin Results
title_fullStr MEMS Young’s Modulus and Step Height Measurements With Round Robin Results
title_full_unstemmed MEMS Young’s Modulus and Step Height Measurements With Round Robin Results
title_short MEMS Young’s Modulus and Step Height Measurements With Round Robin Results
title_sort mems young’s modulus and step height measurements with round robin results
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4548872/
https://www.ncbi.nlm.nih.gov/pubmed/27134790
http://dx.doi.org/10.6028/jres.115.023
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