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Fractional Diffusion, Low Exponent Lévy Stable Laws, and ‘Slow Motion’ Denoising of Helium Ion Microscope Nanoscale Imagery
Helium ion microscopes (HIM) are capable of acquiring images with better than 1 nm resolution, and HIM images are particularly rich in morphological surface details. However, such images are generally quite noisy. A major challenge is to denoise these images while preserving delicate surface informa...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2012
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4553881/ https://www.ncbi.nlm.nih.gov/pubmed/26900518 http://dx.doi.org/10.6028/jres.117.006 |