Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)

Electron-excited X-ray microanalysis performed in the scanning electron microscope with energy-dispersive X-ray spectrometry (EDS) is a core technique for characterization of the microstructure of materials. The recent advances in EDS performance with the silicon drift detector (SDD) enable accuracy...

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Detalles Bibliográficos
Autores principales: Newbury, Dale E., Ritchie, Nicholas W. M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2014
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4555346/
https://www.ncbi.nlm.nih.gov/pubmed/26346887
http://dx.doi.org/10.1007/s10853-014-8685-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4555346/
https://www.ncbi.nlm.nih.gov/pubmed/26346887
http://dx.doi.org/10.1007/s10853-014-8685-2

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