Accounting for partiality in serial crystallography using ray-tracing principles

Serial crystallography generates ‘still’ diffraction data sets that are composed of single diffraction images obtained from a large number of crystals arbitrarily oriented in the X-ray beam. Estimation of the reflection partialities, which accounts for the expected observed fractions of diffraction...

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Detalles Bibliográficos
Autores principales: Kroon-Batenburg, Loes M. J., Schreurs, Antoine M. M., Ravelli, Raimond B. G., Gros, Piet
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4556312/
https://www.ncbi.nlm.nih.gov/pubmed/26327370
http://dx.doi.org/10.1107/S1399004715011803

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4556312/
https://www.ncbi.nlm.nih.gov/pubmed/26327370
http://dx.doi.org/10.1107/S1399004715011803

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