Surface determination through atomically resolved secondary-electron imaging

Unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is com...

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Detalles Bibliográficos
Autores principales: Ciston, J., Brown, H. G., D'Alfonso, A. J., Koirala, P., Ophus, C., Lin, Y., Suzuki, Y., Inada, H., Zhu, Y., Allen, L. J., Marks, L. D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Pub. Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4557350/
https://www.ncbi.nlm.nih.gov/pubmed/26082275
http://dx.doi.org/10.1038/ncomms8358

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4557350/
https://www.ncbi.nlm.nih.gov/pubmed/26082275
http://dx.doi.org/10.1038/ncomms8358

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