Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy

Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM wor...

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Detalles Bibliográficos
Autores principales: Ishibashi, Takayuki, Cai, Yongfu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2015
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4586183/
https://www.ncbi.nlm.nih.gov/pubmed/26415540
http://dx.doi.org/10.1186/s11671-015-1062-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4586183/
https://www.ncbi.nlm.nih.gov/pubmed/26415540
http://dx.doi.org/10.1186/s11671-015-1062-5

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