Cargando…
Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy
Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM wor...
Autores principales: | Ishibashi, Takayuki, Cai, Yongfu |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2015
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4586183/ https://www.ncbi.nlm.nih.gov/pubmed/26415540 http://dx.doi.org/10.1186/s11671-015-1062-5 |
Ejemplares similares
-
Apertureless scanning near-field optical microscopy of sparsely labeled tobacco mosaic viruses and the intermediate filament desmin
por: Harder, Alexander, et al.
Publicado: (2013) -
Near-field optical microscopy of femtosecond-laser-reshaped silver nanoparticles in dielectric matrix
por: Beleites, Moritz, et al.
Publicado: (2012) -
Near- and Far-Field Optical Response of Eccentric Nanoshells
por: Peña-Rodríguez, Ovidio, et al.
Publicado: (2017) -
Layer-dependent nanoscale electrical properties of graphene studied by conductive scanning probe microscopy
por: Zhao, Shihua, et al.
Publicado: (2011) -
Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy
por: Lin, Zhen, et al.
Publicado: (2011)