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A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions

Microcrystals present a significant impediment to the determination of macromolecular structures by X-ray diffraction methods. Although microfocus synchrotron beamlines and X-ray free-electron lasers (XFELs) can enable the collection of interpretable diffraction data from microcrystals, there is a n...

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Detalles Bibliográficos
Autores principales: Murray, Thomas D., Lyubimov, Artem Y., Ogata, Craig M., Vo, Huy, Uervirojnangkoorn, Monarin, Brunger, Axel T., Berger, James M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4601365/
https://www.ncbi.nlm.nih.gov/pubmed/26457423
http://dx.doi.org/10.1107/S1399004715015011