Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition

This paper performs a comparative study on the statistical-variation tolerance between two crossbar architectures which are the complementary and twin architectures. In this comparative study, 10 greyscale images and 26 black-and-white alphabet characters are tested using the circuit simulator to co...

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Detalles Bibliográficos
Autores principales: Truong, Son Ngoc, Shin, SangHak, Byeon, Sang-Don, Song, JaeSang, Mo, Hyun-Sun, Min, Kyeong-Sik
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2015
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4608951/
https://www.ncbi.nlm.nih.gov/pubmed/26474886
http://dx.doi.org/10.1186/s11671-015-1106-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4608951/
https://www.ncbi.nlm.nih.gov/pubmed/26474886
http://dx.doi.org/10.1186/s11671-015-1106-x

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