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Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition

This paper performs a comparative study on the statistical-variation tolerance between two crossbar architectures which are the complementary and twin architectures. In this comparative study, 10 greyscale images and 26 black-and-white alphabet characters are tested using the circuit simulator to co...

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Autores principales: Truong, Son Ngoc, Shin, SangHak, Byeon, Sang-Don, Song, JaeSang, Mo, Hyun-Sun, Min, Kyeong-Sik
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4608951/
https://www.ncbi.nlm.nih.gov/pubmed/26474886
http://dx.doi.org/10.1186/s11671-015-1106-x
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author Truong, Son Ngoc
Shin, SangHak
Byeon, Sang-Don
Song, JaeSang
Mo, Hyun-Sun
Min, Kyeong-Sik
author_facet Truong, Son Ngoc
Shin, SangHak
Byeon, Sang-Don
Song, JaeSang
Mo, Hyun-Sun
Min, Kyeong-Sik
author_sort Truong, Son Ngoc
collection PubMed
description This paper performs a comparative study on the statistical-variation tolerance between two crossbar architectures which are the complementary and twin architectures. In this comparative study, 10 greyscale images and 26 black-and-white alphabet characters are tested using the circuit simulator to compare the recognition rate with varying statistical variation and correlation parameters. As with the simulation results of 10 greyscale image recognitions, the twin crossbar shows better recognition rate by 4 % on average than the complementary one, when the inter-array correlation = 1 and intra-array correlation = 0. When the inter-array correlation = 1 and intra-array correlation = 1, the twin architecture can recognize better by 5.6 % on average than the complementary one. Similarly, when the inter-array correlation = 1 and intra-array correlation = 0, the twin architecture can recognize 26 alphabet characters better by 4.5 % on average than the complementary one. When the inter-array correlation = 1 and intra-array correlation = 1, the twin architecture is better by 6 % on average than the complementary one. By summary, we can conclude that the twin crossbar is more robust than the complementary one under the same amounts of statistical variation and correlation.
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spelling pubmed-46089512015-10-21 Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition Truong, Son Ngoc Shin, SangHak Byeon, Sang-Don Song, JaeSang Mo, Hyun-Sun Min, Kyeong-Sik Nanoscale Res Lett Nano Express This paper performs a comparative study on the statistical-variation tolerance between two crossbar architectures which are the complementary and twin architectures. In this comparative study, 10 greyscale images and 26 black-and-white alphabet characters are tested using the circuit simulator to compare the recognition rate with varying statistical variation and correlation parameters. As with the simulation results of 10 greyscale image recognitions, the twin crossbar shows better recognition rate by 4 % on average than the complementary one, when the inter-array correlation = 1 and intra-array correlation = 0. When the inter-array correlation = 1 and intra-array correlation = 1, the twin architecture can recognize better by 5.6 % on average than the complementary one. Similarly, when the inter-array correlation = 1 and intra-array correlation = 0, the twin architecture can recognize 26 alphabet characters better by 4.5 % on average than the complementary one. When the inter-array correlation = 1 and intra-array correlation = 1, the twin architecture is better by 6 % on average than the complementary one. By summary, we can conclude that the twin crossbar is more robust than the complementary one under the same amounts of statistical variation and correlation. Springer US 2015-10-16 /pmc/articles/PMC4608951/ /pubmed/26474886 http://dx.doi.org/10.1186/s11671-015-1106-x Text en © Truong et al. 2015 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
spellingShingle Nano Express
Truong, Son Ngoc
Shin, SangHak
Byeon, Sang-Don
Song, JaeSang
Mo, Hyun-Sun
Min, Kyeong-Sik
Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition
title Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition
title_full Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition
title_fullStr Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition
title_full_unstemmed Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition
title_short Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition
title_sort comparative study on statistical-variation tolerance between complementary crossbar and twin crossbar of binary nano-scale memristors for pattern recognition
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4608951/
https://www.ncbi.nlm.nih.gov/pubmed/26474886
http://dx.doi.org/10.1186/s11671-015-1106-x
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