Adhesion of voids to bimetal interfaces with non-uniform energies

Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an inte...

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Detalles Bibliográficos
Autores principales: Zheng, Shijian, Shao, Shuai, Zhang, Jian, Wang, Yongqiang, Demkowicz, Michael J., Beyerlein, Irene J., Mara, Nathan A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4614025/
https://www.ncbi.nlm.nih.gov/pubmed/26486278
http://dx.doi.org/10.1038/srep15428

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4614025/
https://www.ncbi.nlm.nih.gov/pubmed/26486278
http://dx.doi.org/10.1038/srep15428

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