Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy

[Image: see text] Photoelectron emission microscopy (PEEM) and differential (optical) reflectance spectroscopy (DRS) have proven independently to be versatile analytical tools for monitoring the evolution of organic thin films during growth. In this paper, we present the first experiment in which bo...

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Detalles Bibliográficos
Autores principales: Ghanbari, Ebrahim, Wagner, Thorsten, Zeppenfeld, Peter
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2015
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4620530/
https://www.ncbi.nlm.nih.gov/pubmed/26523159
http://dx.doi.org/10.1021/acs.jpcc.5b08083

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4620530/
https://www.ncbi.nlm.nih.gov/pubmed/26523159
http://dx.doi.org/10.1021/acs.jpcc.5b08083

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