An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that wi...

Descripción completa

Detalles Bibliográficos
Autores principales: Li, Rui, Ye, Hongfei, Zhang, Weisheng, Ma, Guojun, Su, Yewang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4625185/
https://www.ncbi.nlm.nih.gov/pubmed/26510769
http://dx.doi.org/10.1038/srep15828

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4625185/
https://www.ncbi.nlm.nih.gov/pubmed/26510769
http://dx.doi.org/10.1038/srep15828

Ejemplares similares