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High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field

Optical lithography, the enabling process for defining features, has been widely used in semiconductor industry and many other nanotechnology applications. Advances of nanotechnology require developments of high-throughput optical lithography capabilities to overcome the optical diffraction limit an...

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Autores principales: Wen, X., Datta, A., Traverso, L. M., Pan, L., Xu, X., Moon, E. E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4630802/
https://www.ncbi.nlm.nih.gov/pubmed/26525906
http://dx.doi.org/10.1038/srep16192
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author Wen, X.
Datta, A.
Traverso, L. M.
Pan, L.
Xu, X.
Moon, E. E.
author_facet Wen, X.
Datta, A.
Traverso, L. M.
Pan, L.
Xu, X.
Moon, E. E.
author_sort Wen, X.
collection PubMed
description Optical lithography, the enabling process for defining features, has been widely used in semiconductor industry and many other nanotechnology applications. Advances of nanotechnology require developments of high-throughput optical lithography capabilities to overcome the optical diffraction limit and meet the ever-decreasing device dimensions. We report our recent experimental advancements to scale up diffraction unlimited optical lithography in a massive scale using the near field nanolithography capabilities of bowtie apertures. A record number of near-field optical elements, an array of 1,024 bowtie antenna apertures, are simultaneously employed to generate a large number of patterns by carefully controlling their working distances over the entire array using an optical gap metrology system. Our experimental results reiterated the ability of using massively-parallel near-field devices to achieve high-throughput optical nanolithography, which can be promising for many important nanotechnology applications such as computation, data storage, communication, and energy.
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spelling pubmed-46308022015-11-16 High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field Wen, X. Datta, A. Traverso, L. M. Pan, L. Xu, X. Moon, E. E. Sci Rep Article Optical lithography, the enabling process for defining features, has been widely used in semiconductor industry and many other nanotechnology applications. Advances of nanotechnology require developments of high-throughput optical lithography capabilities to overcome the optical diffraction limit and meet the ever-decreasing device dimensions. We report our recent experimental advancements to scale up diffraction unlimited optical lithography in a massive scale using the near field nanolithography capabilities of bowtie apertures. A record number of near-field optical elements, an array of 1,024 bowtie antenna apertures, are simultaneously employed to generate a large number of patterns by carefully controlling their working distances over the entire array using an optical gap metrology system. Our experimental results reiterated the ability of using massively-parallel near-field devices to achieve high-throughput optical nanolithography, which can be promising for many important nanotechnology applications such as computation, data storage, communication, and energy. Nature Publishing Group 2015-11-03 /pmc/articles/PMC4630802/ /pubmed/26525906 http://dx.doi.org/10.1038/srep16192 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Wen, X.
Datta, A.
Traverso, L. M.
Pan, L.
Xu, X.
Moon, E. E.
High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field
title High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field
title_full High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field
title_fullStr High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field
title_full_unstemmed High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field
title_short High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field
title_sort high throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4630802/
https://www.ncbi.nlm.nih.gov/pubmed/26525906
http://dx.doi.org/10.1038/srep16192
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