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Optimizing pentacene thin-film transistor performance: Temperature and surface condition induced layer growth modification

In this work we present in situ electrical and surface analytical, as well as ex situ atomic force microscopy (AFM) studies on temperature and surface condition induced pentacene layer growth modifications, leading to the selection of optimized deposition conditions and entailing performance improve...

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Detalles Bibliográficos
Autores principales: Lassnig, R., Hollerer, M., Striedinger, B., Fian, A., Stadlober, B., Winkler, A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4630869/
https://www.ncbi.nlm.nih.gov/pubmed/26543442
http://dx.doi.org/10.1016/j.orgel.2015.08.016