Electron Beam Induced Artifacts During in situ TEM Deformation of Nanostructured Metals

A critical assumption underlying in situ transmission electron microscopy studies is that the electron beam (e-beam) exposure does not fundamentally alter the intrinsic deformation behavior of the materials being probed. Here, we show that e-beam exposure causes increased dislocation activation and...

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Detalles Bibliográficos
Autores principales: Sarkar, Rohit, Rentenberger, Christian, Rajagopalan, Jagannathan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4639785/
https://www.ncbi.nlm.nih.gov/pubmed/26552934
http://dx.doi.org/10.1038/srep16345

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4639785/
https://www.ncbi.nlm.nih.gov/pubmed/26552934
http://dx.doi.org/10.1038/srep16345

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