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Electron Beam Induced Artifacts During in situ TEM Deformation of Nanostructured Metals
A critical assumption underlying in situ transmission electron microscopy studies is that the electron beam (e-beam) exposure does not fundamentally alter the intrinsic deformation behavior of the materials being probed. Here, we show that e-beam exposure causes increased dislocation activation and...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4639785/ https://www.ncbi.nlm.nih.gov/pubmed/26552934 http://dx.doi.org/10.1038/srep16345 |