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Grain boundary resistance to amorphization of nanocrystalline silicon carbide
Under the C displacement condition, we have used molecular dynamics simulation to examine the effects of grain boundaries (GBs) on the amorphization of nanocrystalline silicon carbide (nc-SiC) by point defect accumulation. The results show that the interstitials are preferentially absorbed and accum...
Autores principales: | Chen, Dong, Gao, Fei, Liu, Bo |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4642319/ https://www.ncbi.nlm.nih.gov/pubmed/26558694 http://dx.doi.org/10.1038/srep16602 |
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