Will Future Measurement Needs of the Semiconductor Industry Be Met?

We discuss the ability of the nation’s measurement system to meet future metrology needs of the semiconductor industry. Lacking an acceptable metric for assessing the health of metrology for the semiconductor industry, we identify a limited set of unmet measurement needs. Assuming that this set of n...

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Detalles Bibliográficos
Autor principal: Bennett, Herbert S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2007
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4654602/
https://www.ncbi.nlm.nih.gov/pubmed/27110452
http://dx.doi.org/10.6028/jres.112.002
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author Bennett, Herbert S.
author_facet Bennett, Herbert S.
author_sort Bennett, Herbert S.
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description We discuss the ability of the nation’s measurement system to meet future metrology needs of the semiconductor industry. Lacking an acceptable metric for assessing the health of metrology for the semiconductor industry, we identify a limited set of unmet measurement needs. Assuming that this set of needs may serve as proxy for the galaxy of semiconductor measurement needs, we examine it from the perspective of what will be required to continue the semiconductor industry’s powerful impact in the world’s macro-economy and maintain its exceptional record of numerous technological innovations. This paper concludes with suggestions about ways to strengthen the measurement system for the semiconductor industry.
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spelling pubmed-46546022016-04-22 Will Future Measurement Needs of the Semiconductor Industry Be Met? Bennett, Herbert S. J Res Natl Inst Stand Technol Article We discuss the ability of the nation’s measurement system to meet future metrology needs of the semiconductor industry. Lacking an acceptable metric for assessing the health of metrology for the semiconductor industry, we identify a limited set of unmet measurement needs. Assuming that this set of needs may serve as proxy for the galaxy of semiconductor measurement needs, we examine it from the perspective of what will be required to continue the semiconductor industry’s powerful impact in the world’s macro-economy and maintain its exceptional record of numerous technological innovations. This paper concludes with suggestions about ways to strengthen the measurement system for the semiconductor industry. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2007 2007-02-01 /pmc/articles/PMC4654602/ /pubmed/27110452 http://dx.doi.org/10.6028/jres.112.002 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Bennett, Herbert S.
Will Future Measurement Needs of the Semiconductor Industry Be Met?
title Will Future Measurement Needs of the Semiconductor Industry Be Met?
title_full Will Future Measurement Needs of the Semiconductor Industry Be Met?
title_fullStr Will Future Measurement Needs of the Semiconductor Industry Be Met?
title_full_unstemmed Will Future Measurement Needs of the Semiconductor Industry Be Met?
title_short Will Future Measurement Needs of the Semiconductor Industry Be Met?
title_sort will future measurement needs of the semiconductor industry be met?
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4654602/
https://www.ncbi.nlm.nih.gov/pubmed/27110452
http://dx.doi.org/10.6028/jres.112.002
work_keys_str_mv AT bennettherberts willfuturemeasurementneedsofthesemiconductorindustrybemet

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