Exciton-dominated Dielectric Function of Atomically Thin MoS(2) Films

We systematically measure the dielectric function of atomically thin MoS(2) films with different layer numbers and demonstrate that excitonic effects play a dominant role in the dielectric function when the films are less than 5–7 layers thick. The dielectric function shows an anomalous dependence o...

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Detalles Bibliográficos
Autores principales: Yu, Yiling, Yu, Yifei, Cai, Yongqing, Li, Wei, Gurarslan, Alper, Peelaers, Hartwin, Aspnes, David E., Van de Walle, Chris G., Nguyen, Nhan V., Zhang, Yong-Wei, Cao, Linyou
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4657050/
https://www.ncbi.nlm.nih.gov/pubmed/26598075
http://dx.doi.org/10.1038/srep16996

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4657050/
https://www.ncbi.nlm.nih.gov/pubmed/26598075
http://dx.doi.org/10.1038/srep16996

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