Enhanced model for determining the number of graphene layers and their distribution from X-ray diffraction data

A model consisting of an equation that includes graphene thickness distribution is used to calculate theoretical 002 X-ray diffraction (XRD) peak intensities. An analysis was performed upon graphene samples produced by two different electrochemical procedures: electrolysis in aqueous electrolyte and...

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Detalles Bibliográficos
Autores principales: Andonovic, Beti, Ademi, Abdulakim, Grozdanov, Anita, Paunović, Perica, Dimitrov, Aleksandar T
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2015
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4660954/
https://www.ncbi.nlm.nih.gov/pubmed/26665083
http://dx.doi.org/10.3762/bjnano.6.216

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4660954/
https://www.ncbi.nlm.nih.gov/pubmed/26665083
http://dx.doi.org/10.3762/bjnano.6.216

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