Atomic disorder of Li(0.5)Ni(0.5)O thin films caused by Li doping: estimation from X-ray Debye–Waller factors

Cubic type room-temperature (RT) epitaxial Li(0.5)Ni(0.5)O and NiO thin films with [111] orientation grown on ultra-smooth sapphire (0001) substrates were examined using synchrotron-based thin-film X-ray diffraction. The 1[Image: see text]1 and 2[Image: see text]2 rocking curves including six respec...

Descripción completa

Detalles Bibliográficos
Autores principales: Yang, Anli, Sakata, Osami, Yamauchi, Ryosuke, Kumara, L. S. R., Song, Chulho, Katsuya, Yoshio, Matsuda, Akifumi, Yoshimoto, Mamoru
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4665663/
https://www.ncbi.nlm.nih.gov/pubmed/26664345
http://dx.doi.org/10.1107/S1600576715020002

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4665663/
https://www.ncbi.nlm.nih.gov/pubmed/26664345
http://dx.doi.org/10.1107/S1600576715020002

Ejemplares similares