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Atomic disorder of Li(0.5)Ni(0.5)O thin films caused by Li doping: estimation from X-ray Debye–Waller factors
Cubic type room-temperature (RT) epitaxial Li(0.5)Ni(0.5)O and NiO thin films with [111] orientation grown on ultra-smooth sapphire (0001) substrates were examined using synchrotron-based thin-film X-ray diffraction. The 1[Image: see text]1 and 2[Image: see text]2 rocking curves including six respec...
Autores principales: | Yang, Anli, Sakata, Osami, Yamauchi, Ryosuke, Kumara, L. S. R., Song, Chulho, Katsuya, Yoshio, Matsuda, Akifumi, Yoshimoto, Mamoru |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4665663/ https://www.ncbi.nlm.nih.gov/pubmed/26664345 http://dx.doi.org/10.1107/S1600576715020002 |
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