Free Form Deformation–Based Image Registration Improves Accuracy of Traction Force Microscopy

Traction Force Microscopy (TFM) is a widespread method used to recover cellular tractions from the deformation that they cause in their surrounding substrate. Particle Image Velocimetry (PIV) is commonly used to quantify the substrate’s deformations, due to its simplicity and efficiency. However, PI...

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Detalles Bibliográficos
Autores principales: Jorge-Peñas, Alvaro, Izquierdo-Alvarez, Alicia, Aguilar-Cuenca, Rocio, Vicente-Manzanares, Miguel, Garcia-Aznar, José Manuel, Van Oosterwyck, Hans, de-Juan-Pardo, Elena M., Ortiz-de-Solorzano, Carlos, Muñoz-Barrutia, Arrate
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2015
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4671587/
https://www.ncbi.nlm.nih.gov/pubmed/26641883
http://dx.doi.org/10.1371/journal.pone.0144184

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4671587/
https://www.ncbi.nlm.nih.gov/pubmed/26641883
http://dx.doi.org/10.1371/journal.pone.0144184

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