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Free Form Deformation–Based Image Registration Improves Accuracy of Traction Force Microscopy
Traction Force Microscopy (TFM) is a widespread method used to recover cellular tractions from the deformation that they cause in their surrounding substrate. Particle Image Velocimetry (PIV) is commonly used to quantify the substrate’s deformations, due to its simplicity and efficiency. However, PI...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Public Library of Science
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4671587/ https://www.ncbi.nlm.nih.gov/pubmed/26641883 http://dx.doi.org/10.1371/journal.pone.0144184 |