An Abnormal Nitric Oxide Metabolism Contributes to Brain Oxidative Stress in the Mouse Model for the Fragile X Syndrome, a Possible Role in Intellectual Disability

Background. Fragile X syndrome is the most common genetic cause of mental disability. Although many research has been performed, the mechanism underlying the pathogenesis is unclear and needs further investigation. Oxidative stress played major roles in the syndrome. The aim was to investigate the n...

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Detalles Bibliográficos
Autores principales: Lima-Cabello, Elena, Garcia-Guirado, Francisco, Calvo-Medina, Rocio, el Bekay, Rajaa, Perez-Costillas, Lucia, Quintero-Navarro, Carolina, Sanchez-Salido, Lourdes, de Diego-Otero, Yolanda
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2016
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4691629/
https://www.ncbi.nlm.nih.gov/pubmed/26788253
http://dx.doi.org/10.1155/2016/8548910

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4691629/
https://www.ncbi.nlm.nih.gov/pubmed/26788253
http://dx.doi.org/10.1155/2016/8548910

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