Crack tip shielding observed with high-resolution transmission electron microscopy

The dislocation shielding field at a crack tip was experimentally proven at the atomic scale by measuring the local strain in front of the crack tip using high-resolution transmission electron microscopy (HRTEM) and geometric phase analysis (GPA). Single crystalline (110) silicon wafers were employe...

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Detalles Bibliográficos
Autores principales: Adhika, Damar Rastri, Tanaka, Masaki, Daio, Takeshi, Higashida, Kenji
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2015
Materias:
Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4711291/
https://www.ncbi.nlm.nih.gov/pubmed/26115957
http://dx.doi.org/10.1093/jmicro/dfv032

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4711291/
https://www.ncbi.nlm.nih.gov/pubmed/26115957
http://dx.doi.org/10.1093/jmicro/dfv032

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