Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction

Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain pro...

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Detalles Bibliográficos
Autores principales: Schick, Daniel, Herzog, Marc, Bojahr, André, Leitenberger, Wolfram, Hertwig, Andreas, Shayduk, Roman, Bargheer, Matias
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2014
Materias:
Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4714650/
https://www.ncbi.nlm.nih.gov/pubmed/26798784
http://dx.doi.org/10.1063/1.4901228

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4714650/
https://www.ncbi.nlm.nih.gov/pubmed/26798784
http://dx.doi.org/10.1063/1.4901228

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