Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM

We present results from an imaging study of filamentary conduction in silicon suboxide resistive RAM devices. We used a conductive atomic force microscope to etch through devices while measuring current, allowing us to produce tomograms of conductive filaments. To our knowledge this is the first rep...

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Detalles Bibliográficos
Autores principales: Buckwell, Mark, Montesi, Luca, Hudziak, Stephen, Mehonic, Adnan, Kenyon, Anthony J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Royal Society of Chemistry 2015
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4718172/
https://www.ncbi.nlm.nih.gov/pubmed/26482563
http://dx.doi.org/10.1039/c5nr04982b

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4718172/
https://www.ncbi.nlm.nih.gov/pubmed/26482563
http://dx.doi.org/10.1039/c5nr04982b

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