Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM

We present results from an imaging study of filamentary conduction in silicon suboxide resistive RAM devices. We used a conductive atomic force microscope to etch through devices while measuring current, allowing us to produce tomograms of conductive filaments. To our knowledge this is the first rep...

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Detalles Bibliográficos
Autores principales: Buckwell, Mark, Montesi, Luca, Hudziak, Stephen, Mehonic, Adnan, Kenyon, Anthony J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Royal Society of Chemistry 2015
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4718172/
https://www.ncbi.nlm.nih.gov/pubmed/26482563
http://dx.doi.org/10.1039/c5nr04982b
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author Buckwell, Mark
Montesi, Luca
Hudziak, Stephen
Mehonic, Adnan
Kenyon, Anthony J.
author_facet Buckwell, Mark
Montesi, Luca
Hudziak, Stephen
Mehonic, Adnan
Kenyon, Anthony J.
author_sort Buckwell, Mark
collection PubMed
description We present results from an imaging study of filamentary conduction in silicon suboxide resistive RAM devices. We used a conductive atomic force microscope to etch through devices while measuring current, allowing us to produce tomograms of conductive filaments. To our knowledge this is the first report of such measurements in an intrinsic resistance switching material.
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spelling pubmed-47181722016-02-02 Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM Buckwell, Mark Montesi, Luca Hudziak, Stephen Mehonic, Adnan Kenyon, Anthony J. Nanoscale Chemistry We present results from an imaging study of filamentary conduction in silicon suboxide resistive RAM devices. We used a conductive atomic force microscope to etch through devices while measuring current, allowing us to produce tomograms of conductive filaments. To our knowledge this is the first report of such measurements in an intrinsic resistance switching material. Royal Society of Chemistry 2015-11-21 2015-10-20 /pmc/articles/PMC4718172/ /pubmed/26482563 http://dx.doi.org/10.1039/c5nr04982b Text en This journal is © The Royal Society of Chemistry 2015 http://creativecommons.org/licenses/by/3.0/ This is an Open Access article distributed under the terms of the Creative Commons Attribution 3.0 Unported License (http://creativecommons.org/licenses/by/3.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Chemistry
Buckwell, Mark
Montesi, Luca
Hudziak, Stephen
Mehonic, Adnan
Kenyon, Anthony J.
Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM
title Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM
title_full Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM
title_fullStr Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM
title_full_unstemmed Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM
title_short Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM
title_sort conductance tomography of conductive filaments in intrinsic silicon-rich silica rram
topic Chemistry
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4718172/
https://www.ncbi.nlm.nih.gov/pubmed/26482563
http://dx.doi.org/10.1039/c5nr04982b
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