Polarized Raman scattering study of kesterite type Cu(2)ZnSnS(4) single crystals

A non-destructive Raman spectroscopy has been widely used as a complimentary method to X-ray diffraction characterization of Cu(2)ZnSnS(4) (CZTS) thin films, yet our knowledge of the Raman active fundamental modes in this material is far from complete. Focusing on polarized Raman spectroscopy provid...

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Detalles Bibliográficos
Autores principales: Guc, Maxim, Levcenko, Sergiu, Bodnar, Ivan V., Izquierdo-Roca, Victor, Fontane, Xavier, Volkova, Larisa V., Arushanov, Ernest, Pérez-Rodríguez, Alejandro
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4726006/
https://www.ncbi.nlm.nih.gov/pubmed/26776727
http://dx.doi.org/10.1038/srep19414

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4726006/
https://www.ncbi.nlm.nih.gov/pubmed/26776727
http://dx.doi.org/10.1038/srep19414

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