Cargando…
A multi-subband Monte Carlo study on dominance of scattering mechanisms over carrier transport in sub-10-nm Si nanowire FETs
Dominance of various scattering mechanisms in determination of the carrier mobility is examined for silicon (Si) nanowires of sub-10-nm cross-sections. With a focus on p-type channels, the steady-state hole mobility is studied with multi-subband Monte Carlo simulations to consider quantum effects in...
Autor principal: | Ryu, Hoon |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2016
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4729720/ https://www.ncbi.nlm.nih.gov/pubmed/26815605 http://dx.doi.org/10.1186/s11671-016-1249-4 |
Ejemplares similares
-
Novel 14-nm Scallop-Shaped FinFETs (S-FinFETs) on Bulk-Si Substrate
por: Xu, Weijia, et al.
Publicado: (2015) -
Photoconductivity, pH Sensitivity, Noise, and Channel Length Effects in Si Nanowire FET Sensors
por: Gasparyan, Ferdinand, et al.
Publicado: (2018) -
The fabrication of large-scale sub-10-nm core-shell silicon nanowire arrays
por: Su, Shiming, et al.
Publicado: (2013) -
Low-frequency flicker noise in a MSM device made with single Si nanowire (diameter ≈ 50 nm)
por: Samanta, Sudeshna, et al.
Publicado: (2013) -
Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology
por: Wang, Chien-Ping, et al.
Publicado: (2021)