Cargando…
Ultra-high-throughput Production of III-V/Si Wafer for Electronic and Photonic Applications
Si-based integrated circuits have been intensively developed over the past several decades through ultimate device scaling. However, the Si technology has reached the physical limitations of the scaling. These limitations have fuelled the search for alternative active materials (for transistors) and...
Autores principales: | , , , , , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4750074/ https://www.ncbi.nlm.nih.gov/pubmed/26864968 http://dx.doi.org/10.1038/srep20610 |
_version_ | 1782415372652118016 |
---|---|
author | Geum, Dae-Myeong Park, Min-Su Lim, Ju Young Yang, Hyun-Duk Song, Jin Dong Kim, Chang Zoo Yoon, Euijoon Kim, SangHyeon Choi, Won Jun |
author_facet | Geum, Dae-Myeong Park, Min-Su Lim, Ju Young Yang, Hyun-Duk Song, Jin Dong Kim, Chang Zoo Yoon, Euijoon Kim, SangHyeon Choi, Won Jun |
author_sort | Geum, Dae-Myeong |
collection | PubMed |
description | Si-based integrated circuits have been intensively developed over the past several decades through ultimate device scaling. However, the Si technology has reached the physical limitations of the scaling. These limitations have fuelled the search for alternative active materials (for transistors) and the introduction of optical interconnects (called “Si photonics”). A series of attempts to circumvent the Si technology limits are based on the use of III-V compound semiconductor due to their superior benefits, such as high electron mobility and direct bandgap. To use their physical properties on a Si platform, the formation of high-quality III-V films on the Si (III-V/Si) is the basic technology ; however, implementing this technology using a high-throughput process is not easy. Here, we report new concepts for an ultra-high-throughput heterogeneous integration of high-quality III-V films on the Si using the wafer bonding and epitaxial lift off (ELO) technique. We describe the ultra-fast ELO and also the re-use of the III-V donor wafer after III-V/Si formation. These approaches provide an ultra-high-throughput fabrication of III-V/Si substrates with a high-quality film, which leads to a dramatic cost reduction. As proof-of-concept devices, this paper demonstrates GaAs-based high electron mobility transistors (HEMTs), solar cells, and hetero-junction phototransistors on Si substrates. |
format | Online Article Text |
id | pubmed-4750074 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-47500742016-02-18 Ultra-high-throughput Production of III-V/Si Wafer for Electronic and Photonic Applications Geum, Dae-Myeong Park, Min-Su Lim, Ju Young Yang, Hyun-Duk Song, Jin Dong Kim, Chang Zoo Yoon, Euijoon Kim, SangHyeon Choi, Won Jun Sci Rep Article Si-based integrated circuits have been intensively developed over the past several decades through ultimate device scaling. However, the Si technology has reached the physical limitations of the scaling. These limitations have fuelled the search for alternative active materials (for transistors) and the introduction of optical interconnects (called “Si photonics”). A series of attempts to circumvent the Si technology limits are based on the use of III-V compound semiconductor due to their superior benefits, such as high electron mobility and direct bandgap. To use their physical properties on a Si platform, the formation of high-quality III-V films on the Si (III-V/Si) is the basic technology ; however, implementing this technology using a high-throughput process is not easy. Here, we report new concepts for an ultra-high-throughput heterogeneous integration of high-quality III-V films on the Si using the wafer bonding and epitaxial lift off (ELO) technique. We describe the ultra-fast ELO and also the re-use of the III-V donor wafer after III-V/Si formation. These approaches provide an ultra-high-throughput fabrication of III-V/Si substrates with a high-quality film, which leads to a dramatic cost reduction. As proof-of-concept devices, this paper demonstrates GaAs-based high electron mobility transistors (HEMTs), solar cells, and hetero-junction phototransistors on Si substrates. Nature Publishing Group 2016-02-11 /pmc/articles/PMC4750074/ /pubmed/26864968 http://dx.doi.org/10.1038/srep20610 Text en Copyright © 2016, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Geum, Dae-Myeong Park, Min-Su Lim, Ju Young Yang, Hyun-Duk Song, Jin Dong Kim, Chang Zoo Yoon, Euijoon Kim, SangHyeon Choi, Won Jun Ultra-high-throughput Production of III-V/Si Wafer for Electronic and Photonic Applications |
title | Ultra-high-throughput Production of III-V/Si Wafer for Electronic and Photonic Applications |
title_full | Ultra-high-throughput Production of III-V/Si Wafer for Electronic and Photonic Applications |
title_fullStr | Ultra-high-throughput Production of III-V/Si Wafer for Electronic and Photonic Applications |
title_full_unstemmed | Ultra-high-throughput Production of III-V/Si Wafer for Electronic and Photonic Applications |
title_short | Ultra-high-throughput Production of III-V/Si Wafer for Electronic and Photonic Applications |
title_sort | ultra-high-throughput production of iii-v/si wafer for electronic and photonic applications |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4750074/ https://www.ncbi.nlm.nih.gov/pubmed/26864968 http://dx.doi.org/10.1038/srep20610 |
work_keys_str_mv | AT geumdaemyeong ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications AT parkminsu ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications AT limjuyoung ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications AT yanghyunduk ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications AT songjindong ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications AT kimchangzoo ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications AT yooneuijoon ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications AT kimsanghyeon ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications AT choiwonjun ultrahighthroughputproductionofiiivsiwaferforelectronicandphotonicapplications |