Three-dimensional full-field X-ray orientation microscopy

A previously introduced mathematical framework for full-field X-ray orientation microscopy is for the first time applied to experimental near-field diffraction data acquired from a polycrystalline sample. Grain by grain tomographic reconstructions using convex optimization and prior knowledge are ca...

Descripción completa

Detalles Bibliográficos
Autores principales: Viganò, Nicola, Tanguy, Alexandre, Hallais, Simon, Dimanov, Alexandre, Bornert, Michel, Batenburg, Kees Joost, Ludwig, Wolfgang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4751536/
https://www.ncbi.nlm.nih.gov/pubmed/26868303
http://dx.doi.org/10.1038/srep20618

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4751536/
https://www.ncbi.nlm.nih.gov/pubmed/26868303
http://dx.doi.org/10.1038/srep20618

Ejemplares similares