Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscop...

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Detalles Bibliográficos
Autores principales: Zhou, Yangbo, Fox, Daniel S, Maguire, Pierce, O’Connell, Robert, Masters, Robert, Rodenburg, Cornelia, Wu, Hanchun, Dapor, Maurizio, Chen, Ying, Zhang, Hongzhou
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4754635/
https://www.ncbi.nlm.nih.gov/pubmed/26878907
http://dx.doi.org/10.1038/srep21045

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4754635/
https://www.ncbi.nlm.nih.gov/pubmed/26878907
http://dx.doi.org/10.1038/srep21045

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