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Strong hole-doping and robust resistance-decrease in proton-irradiated graphene

Great effort has been devoted in recent years to improve the electrical conductivity of graphene for use in practical applications. Here, we demonstrate the hole carrier density of CVD graphene on a SiO(2)/Si substrate increases by more than one order of magnitude to n = 3 × 10(13) cm(−2) after irra...

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Detalles Bibliográficos
Autores principales: Lee, Chul, Kim, Jiho, Kim, SangJin, Chang, Young Jun, Kim, Keun Soo, Hong, ByungHee, Choi, E. J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4758087/
https://www.ncbi.nlm.nih.gov/pubmed/26888197
http://dx.doi.org/10.1038/srep21311